ASIAS Symposium Presentations

Other, Elizabeth Foughty's Collection - 13 years, 7 months ago

Shared By: Elizabeth Foughty

Aviation Safety Information Analysis and Sharing (ASIAS) Symposiusm Presentations: July 27-28, 2009

Aviation Safety 2009 IVHM Posters

Other, Elizabeth Foughty's Collection - 13 years, 7 months ago

Shared By: Elizabeth Foughty

Posters form 2009 Aviation Safety Technical Conference

Aviation Safety 2009 IVHM Presentations

Other, Elizabeth Foughty's Collection - 13 years, 7 months ago

Shared By: Elizabeth Foughty

IVHM Presentations

CIDU Presentations

Other, Elizabeth Foughty's Collection - 13 years, 7 months ago

Shared By: Elizabeth Foughty

CIDU Presentations

AISRP Presentations

Other, Elizabeth Foughty's Collection - 13 years, 7 months ago

Shared By: Elizabeth Foughty

AISRP Presentations from CIDU/AISRP 2009.

Classifying Things That Go Bang in the Night

Other, Elizabeth Foughty's Collection - 13 years, 7 months ago

Shared By: Elizabeth Foughty

The automated, real-time classification of variable and transient events in terms of their astrophysical nature is quickly becoming a necessity for the new synoptic sky ...

Fault Tolerance, Diagnostics, and Prognostics in Aircraft Flight

Other, Elizabeth Foughty's Collection - 13 years, 7 months ago

Shared By: Elizabeth Foughty

Abstract In modern fighter aircraft with statically unstable airframe designs, the flight control system is considered flight critical, i.e. the aircraft will encounter a catastrophic ...

Health Monitoring and Prognostics for Computer Servers

Other, Elizabeth Foughty's Collection - 13 years, 7 months ago

Shared By: Elizabeth Foughty

Abstract Prognostics solutions for mission critical systems require a comprehensive methodology for proactively detecting and isolating failures, recommending and guiding condition-based maintenance actions, and estimating ...

Identification of Spatial Fault Patterns in Semiconductor Wafers

Other, Elizabeth Foughty's Collection - 13 years, 7 months ago

Shared By: Elizabeth Foughty

Abstract The semiconductor industry is constantly searching for new ways to increase the rate of both process development and yield learning. As more data is ...